สถานที่กำเนิด
Shanghai, China
Analysis principle
Energy dispersive X-ray fluorescence analysis
Element measuring range
Any element from Na(11)-U(92)
Min. measuring limit
Cd/Hg/Br/Cr/Pb≤2 ppm
Sample shape
Arbitrary size, any irregular shape
Sample type
Plastic/metal/film/powder/liquid etc
Sample exposure diameter
2, 5, 8mm
Detector
Si-PIN or SDD detector, high speed pulse height analysis system